Electron Microscopes and Ion Beam Microscopes - FEI

Description: FEI is the world leader in electron microscopy technologies and applications that delivers subnanometer resolution for materials research, life sciences and electronics with resolution down to the sub-Ångström level. See our line of electron microscopes, including scanning electron microscopes (SEM), transmission electron microscopes (TEM), dualBeam instruments, and focused ion beam (FIB) instruments.

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